ATOMIC FORCE MICROSCOPE ANALYSIS

   
         
Atomic Force Microscope        
         
   
         
Atomic Force Microscope   Tip of AFM   Analytical - AFM
         
 
AFM of stepped surface of an Al2O3 wafer after O2 annealing
         
       
 
 
AFM of different SrTiO3 substrates after Ti - termination
 
AFM of an Al2O3 wafer with GaN layer and a deep defect
     
     
AFM of a GaN single crystal grown
out of a GaN layer
AFM of a GaN crystal grown
through a GaN layer
AFM of a GaN layer with growth
defects resulting out of scratches
in the Al2O3 substrate
     
     
 AFM of a GaN layer with a large
defect resulting out of resin
remains on the substrate
 AFM of a scratch made by
handcleaning on a Al2O3 substrate
AFM of BaTiO3 substrate with
lamellas out of phase transition Stress