Gallium Arsenide, Semi-Conducting (HB/VB)
Growth method | Horizontal Bridgman and Vertical Bridgman |
Conductivity | N or P type |
Orientation | (100), and off oriented ± .5 degree Other orientations and tolerance to ± .1 degree available on request |
Wafer Diameter | 2.000 ± 0.015 3.000 ± 0.025 inches Other diameters available on request |
Wafer Thickness | 400 ± 25 500 ± 25 microns Other thicknesses to 250 microns available on request |
Rectangular Wafer Sizes |
25 mm x 45 mm (+0, - 1 mm) 38 mm x 45 mm (+0, - 1 mm) 45 mm x 45 mm (+0, - 1 mm) 52 mm x 57 mm (+0.6, - 0.4 mm) All rectangular wafers sized with (110) cleavage plane parallel to wafer sides. |
Surface | As Cut* Polished one side etched back side Polished both sides |
Etch Pit Density Ranges |
£ 2,000 £ 5,000 £ 10,000 > 10,000 cm-² |
Carrier Concentration | N = 5 x 1016 – 4 x 1018 cm-³ P = 6 x 1017 – 3 x 1019 cm-³ |
Mobility | N = 1,200 – 2.400 cm² / v-sec P = 40 – 100 cm² / v-sec |
Resistivity | N = 1.1 – 15.0 x 10-³ ohm-cm P = 0.8 – 12.0 x 10-² ohm-cm |
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