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Silicon Carbide (SiC)

Crystal properties
Silicon Carbide
Crystal Type 6H-SiC
Formular weight 40.10
Unit cell and constant Hexagonal
a = 3.073 Angstrom,
c = 15.117 Angstrom
Stacking sequence ABCACB ( 6H )  
on axis (0001) +/- 4 minutes  
Type N - type  
Nd – Na. Nd - Na = 5 X 1015 to 1 x 1019 / cm3
Nd = Number density of electron donors
Na = Number density of electron acceptors (holes)
Nd - Na = Net Carrier Concentration
Resistivity 0.06 +/- 0.02 Ohm-cm
Micro-pipe Density. ~200 / cm2
Polish One side (Si-face) polished, back side Carbon face
Band Gap 2.93 eV (Indirect)
Dielectric Constant ƒÃ(11) = ƒÃ(22) = 9.66, ƒÃ(33) = 10.33
Thermal Conductivity at 300K 5 W / cm.K
Growth method Seeded Crystal –
Vapor Phase Transport
Modified Lally Process
Size Up to 4 inch
 
Crystal Type 4H-SiC
Unit cell and constant Hexagonal
a = 3.076 Angstrom
c = 10.053 Angstrom
Stacking sequence ABAC (4H)
on axis (0001) +/- 0.5°
Type N - type
Polish One side (Si-face) polished
Size Up to 4”

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