Analytical Services

 

Atomic Force Microscope			Tip of AFM Analytocal - AFM
AFM of stepped surface of an Al2O3 wafer after O2 annealing

AFM of different SrTiO3 substrates after Ti - termination

AFM of an Al2O3 wafer with GaN layer and a deep defect
AFM of a GaN single crystal grown out of a GaN layer	AFM of a GaN crystal grown through a GaN layer	AFM of a GaN layer with growth defects resulting out of scratches in the Al2O3 substrate
AFM of a GaN layer with a large defect resulting out of resin remains on the substrate	AFM of a scratch made by handcleaning on a Al2O3 substrate	AFM of BaTiO3 substrate with lamellas out of phase transition Stress